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Contactless measurement of bulk lifetime and surface recombination velocity in silicon wafers

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https://hal-amu.archives-ouvertes.fr/hal-03350302
Contributor : Olivier Palais Connect in order to contact the contributor
Submitted on : Tuesday, September 21, 2021 - 11:15:20 AM
Last modification on : Tuesday, October 19, 2021 - 10:50:07 PM

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O. Palais, A. Arcari. Contactless measurement of bulk lifetime and surface recombination velocity in silicon wafers. Journal of Applied Physics, American Institute of Physics, 2003, 93 (8), pp.4686-4690. ⟨10.1063/1.1562741⟩. ⟨hal-03350302⟩

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