Journal Articles
Journal of Applied Physics
Year : 2003
Olivier Palais : Connect in order to contact the contributor
https://hal-amu.archives-ouvertes.fr/hal-03350302
Submitted on : Tuesday, September 21, 2021-11:15:20 AM
Last modification on : Tuesday, October 19, 2021-10:50:07 PM
Cite
O. Palais, A. Arcari. Contactless measurement of bulk lifetime and surface recombination velocity in silicon wafers. Journal of Applied Physics, 2003, 93 (8), pp.4686-4690. ⟨10.1063/1.1562741⟩. ⟨hal-03350302⟩
61
View
0
Download