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Journal Articles Journal of Applied Physics Year : 2003

Contactless measurement of bulk lifetime and surface recombination velocity in silicon wafers

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hal-03350302 , version 1 (21-09-2021)

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O. Palais, A. Arcari. Contactless measurement of bulk lifetime and surface recombination velocity in silicon wafers. Journal of Applied Physics, 2003, 93 (8), pp.4686-4690. ⟨10.1063/1.1562741⟩. ⟨hal-03350302⟩
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