Journal Articles
Materials Science in Semiconductor Processing
Year : 2001
Olivier Palais : Connect in order to contact the contributor
https://hal-amu.archives-ouvertes.fr/hal-03350313
Submitted on : Tuesday, September 21, 2021-11:18:22 AM
Last modification on : Friday, March 24, 2023-2:53:22 PM
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- HAL Id : hal-03350313 , version 1
- DOI : 10.1016/S1369-8001(00)00162-1
Cite
O. Palais, S. Martinuzzi, J.J. Simon. Minority carrier lifetime and metallic-impurity mapping in silicon wafers. Materials Science in Semiconductor Processing, 2001, 4 (1-3), pp.27-29. ⟨10.1016/S1369-8001(00)00162-1⟩. ⟨hal-03350313⟩
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