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From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry

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Automatic Control Engineering

Mohammed AL-KHARAZ  : Connect in order to contact the contributor

https://hal-amu.archives-ouvertes.fr/hal-03523113

Submitted on : Wednesday, January 12, 2022-2:46:13 PM

Last modification on : Friday, March 24, 2023-2:53:25 PM

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hal-03523113 , version 1 (12-01-2022)

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Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton. From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry. 2021 European Control Conference (ECC), Jun 2021, Delft, Netherlands. pp.1768-1773, ⟨10.23919/ECC54610.2021.9655083⟩. ⟨hal-03523113⟩

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