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Multi-scale, multi-physics modeling and simulation of single-event effects at device and circuit levels

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Abstract

This short-course aims to provide a state-of-the-art overview of modeling and simulation of single-event effects (SEEs) at device and circuit levels. It primarily focuses on the specific multi-scale, multi-physics, multi-domain nature of SEEs and on the main underlying physical mechanisms that lead to the occurrence of soft errors in digital circuits. In the first and main part of this contribution, a meticulous review will address the different ways to model and simulate both in space and time this complex sequence of mechanisms from the particlematerial interaction up to the electrical response of a given circuit. In a second part, the text will present some specifics of modern technologies subjected to SEEs in terms of material diversity, device architectures and circuit layout complication. This short-course will conclude by an overview of works and challenges ahead to anticipate the SEE susceptibility of future nano-devices and related circuits.
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Dates and versions

hal-03796081 , version 1 (04-10-2022)

Identifiers

  • HAL Id : hal-03796081 , version 1

Cite

Jean-Luc Autran, Daniela Munteanu. Multi-scale, multi-physics modeling and simulation of single-event effects at device and circuit levels. IEEE Nuclear and Space Radiation Effects Conference (NSREC 2022), Jul 2022, Provo, United States. ⟨hal-03796081⟩
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