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Local defect-free elastic strain relaxation of Si1-xGex embedded into SiO2

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https://hal-amu.archives-ouvertes.fr/hal-03812512
Contributor : Isabelle Berbezier Connect in order to contact the contributor
Submitted on : Wednesday, October 19, 2022 - 12:30:26 PM
Last modification on : Wednesday, November 30, 2022 - 3:08:35 AM

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Elie Assaf, Isabelle Berbezier, Mohammed Bouabdellaoui, Marco Abbarchi, Antoine Ronda, et al.. Local defect-free elastic strain relaxation of Si1-xGex embedded into SiO2. Applied Surface Science, 2022, 590, pp.153015. ⟨10.1016/j.apsusc.2022.153015⟩. ⟨hal-03812512⟩

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