Skip to Main content Skip to Navigation
Conference papers

In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth

Document type :
Conference papers
Complete list of metadatas

https://hal-amu.archives-ouvertes.fr/hal-01452264
Contributor : Im2np Bibliométrie <>
Submitted on : Wednesday, February 1, 2017 - 5:14:58 PM
Last modification on : Friday, March 29, 2019 - 10:36:05 AM

Identifiers

  • HAL Id : hal-01452264, version 1

Collections

Citation

M.G. Tsoutsouva, T. Riberi-Béridot, G. Reinhart, G. Regula, Nathalie Mangelinck-Noël. In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth. Silicon PV2016, Mar 2016, Chambéry, France. ⟨hal-01452264⟩

Share

Metrics

Record views

128