HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Conference papers

In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth

M.G. Tsoutsouva 1 T. Riberi-Béridot 1 G. Reinhart 1 G. Regula 1 Nathalie Mangelinck-Noël 1
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
Document type :
Conference papers
Complete list of metadata
https://hal-amu.archives-ouvertes.fr/hal-01452264
Contributor : Im2np Bibliométrie Connect in order to contact the contributor
Submitted on : Wednesday, February 1, 2017 - 5:14:58 PM
Last modification on : Wednesday, November 3, 2021 - 10:00:53 AM

Identifiers

  • HAL Id : hal-01452264, version 1

Collections

UNIV-AMU | CNRS | UNIV-TLN | IM2NP | MCA_IM2NP

Citation

M.G. Tsoutsouva, T. Riberi-Béridot, G. Reinhart, G. Regula, Nathalie Mangelinck-Noël. In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth. Silicon PV2016, Mar 2016, Chambéry, France. ⟨hal-01452264⟩

Export

BibTeX TEI DC DCterms EndNote Datacite

Share

Metrics

Record views

146