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In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth

M.G. Tsoutsouva 1 T. Riberi-Béridot 1 G. Reinhart 1 G. Regula 1 Nathalie Mangelinck-Noël 1 
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
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https://hal-amu.archives-ouvertes.fr/hal-01452264
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Submitted on : Wednesday, February 1, 2017 - 5:14:58 PM
Last modification on : Wednesday, November 3, 2021 - 10:00:53 AM

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  • HAL Id : hal-01452264, version 1

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UNIV-TLN | CNRS | UNIV-AMU | IM2NP | MCA_IM2NP

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M.G. Tsoutsouva, T. Riberi-Béridot, G. Reinhart, G. Regula, Nathalie Mangelinck-Noël. In situ Synchrotron X-ray Imaging of Extended Defects Generation and Evolution during Monocrystalline Si Seeded Growth. Silicon PV2016, Mar 2016, Chambéry, France. ⟨hal-01452264⟩

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