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Strain and Lattice Orientation Mapping using Advanced X-ray Nano-Diffraction

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Submitted on : Thursday, February 2, 2017 - 10:59:55 AM
Last modification on : Wednesday, November 3, 2021 - 7:28:32 AM

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  • HAL Id : hal-01452740, version 1

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O. Thomas. Strain and Lattice Orientation Mapping using Advanced X-ray Nano-Diffraction. 14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics–Experiment and Simulation, May 2016, Dresden, Germany. ⟨hal-01452740⟩

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