In situ nano-mechanical tests in the light of nano- focused synchrotron X-ray diffraction

T. Cornelius; Z. Ren; C. Leclere; M. Dupraz; G. Beutier; M. Verdier; O. Robach; J.-S. Micha; G. Richter; E. Rabkin; O. Thomas

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In situ nano-mechanical tests in the light of nano- focused synchrotron X-ray diffraction

(1) , , (1) , , , , , , , , (1)

1

T. Cornelius

Function : Author
PersonId : 18168
IdHAL : thcornelius
ORCID : 0000-0003-4272-4720
IdRef : 200023373

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

CV

Z. Ren

Function : Author

C. Leclere

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

M. Dupraz

Function : Author

G. Beutier

Function : Author

M. Verdier

Function : Author
PersonId : 742072
IdHAL : marc-verdier
ORCID : 0000-0003-0563-2675
IdRef : 123967678

O. Robach

Function : Author

J.-S. Micha

Function : Author

G. Richter

Function : Author

E. Rabkin

Function : Author

O. Thomas

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Domains

Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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Submitted on : Thursday, February 2, 2017-1:34:35 PM

Last modification on : Friday, March 24, 2023-2:53:03 PM

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hal-01452925 , version 1 (02-02-2017)

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HAL Id : hal-01452925 , version 1

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T. Cornelius, Z. Ren, C. Leclere, M. Dupraz, G. Beutier, et al.. In situ nano-mechanical tests in the light of nano- focused synchrotron X-ray diffraction. MRS Fall Meeting 2016, Nov 2016, Boston, United States. ⟨hal-01452925⟩

In situ nano-mechanical tests in the light of nano- focused synchrotron X-ray diffraction

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