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https://hal-amu.archives-ouvertes.fr/hal-01452925
Submitted on : Thursday, February 2, 2017-1:34:35 PM
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- HAL Id : hal-01452925 , version 1
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T. Cornelius, Z. Ren, C. Leclere, M. Dupraz, G. Beutier, et al.. In situ nano-mechanical tests in the light of nano- focused synchrotron X-ray diffraction. MRS Fall Meeting 2016, Nov 2016, Boston, United States. ⟨hal-01452925⟩
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