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In situ X-ray diffraction studies of the piezoelectric behavior of PZT thin films

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https://hal-amu.archives-ouvertes.fr/hal-01453244
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Submitted on : Thursday, February 2, 2017 - 4:26:18 PM
Last modification on : Wednesday, May 16, 2018 - 3:20:04 PM

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  • HAL Id : hal-01453244, version 1

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T.W. Cornelius, C. Mocuta, S. Escoubas, E.C. Lima, E.B. Araujo, et al.. In situ X-ray diffraction studies of the piezoelectric behavior of PZT thin films. Meeting of the French Crystallography Association (AFC 2016), Jul 2016, Marseille, France. ⟨hal-01453244⟩

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