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HRTEM study of structural defects and related deformation mechanisms induced by nanocompression of silicon

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https://hal-amu.archives-ouvertes.fr/hal-01453338
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Submitted on : Thursday, February 2, 2017 - 4:50:48 PM
Last modification on : Thursday, March 15, 2018 - 4:56:07 PM

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  • HAL Id : hal-01453338, version 1

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A. Merabet, M. Texier, C. Tromas, M. Verdier, A. Talneau, et al.. HRTEM study of structural defects and related deformation mechanisms induced by nanocompression of silicon. European Microscopy Congress, Aug 2016, Lyon, France. ⟨hal-01453338⟩

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