Characterization of TiO2 antireflection coatings elaborated by APCVD for monocrystalline silicon solar cells - Archive ouverte HAL Access content directly
Journal Articles physica status solidi (c) Year : 2015

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hal-01757647 , version 1 (03-04-2018)

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D. Hocine, M. Belkaid, M. Pasquinelli, Ludovic Escoubas, P. Torchio, et al.. Characterization of TiO2 antireflection coatings elaborated by APCVD for monocrystalline silicon solar cells. physica status solidi (c), 2015, 12 (3), pp.323 - 326. ⟨10.1002/pssc.201400085⟩. ⟨hal-01757647⟩
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