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Characterization of TiO2 antireflection coatings elaborated by APCVD for monocrystalline silicon solar cells

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https://hal-amu.archives-ouvertes.fr/hal-01757647
Contributor : Philippe Torchio <>
Submitted on : Tuesday, April 3, 2018 - 6:31:37 PM
Last modification on : Monday, September 23, 2019 - 2:36:04 PM

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D. Hocine, M. Belkaid, M. Pasquinelli, Ludovic Escoubas, P. Torchio, et al.. Characterization of TiO2 antireflection coatings elaborated by APCVD for monocrystalline silicon solar cells. physica status solidi (c), Wiley, 2015, 12 (3), pp.323 - 326. ⟨10.1002/pssc.201400085⟩. ⟨hal-01757647⟩

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