TESTING THE FRICTIONAL PROPERTIES OF MoO 3 THIN FILM SURFACE WITH AFM: A NANOSCOPIC LEVEL INVESTIGATION - Archive ouverte HAL Access content directly
Journal Articles Surface Review and Letters Year : 1997

TESTING THE FRICTIONAL PROPERTIES OF MoO 3 THIN FILM SURFACE WITH AFM: A NANOSCOPIC LEVEL INVESTIGATION

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Physics [physics]

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https://hal-amu.archives-ouvertes.fr/hal-01770315

Submitted on : Wednesday, April 18, 2018-6:15:29 PM

Last modification on : Wednesday, February 8, 2023-5:11:04 PM

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hal-01770315 , version 1 (18-04-2018)

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Hubert Klein, D. Pailharey, Y. Mathey, F. Torregrossa. TESTING THE FRICTIONAL PROPERTIES OF MoO 3 THIN FILM SURFACE WITH AFM: A NANOSCOPIC LEVEL INVESTIGATION. Surface Review and Letters, 1997, 04 (05), pp.1031 - 1034. ⟨10.1142/S0218625X97001231⟩. ⟨hal-01770315⟩

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