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Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1D Case Applied to 28 nm FD-SOI Devices

Abstract : We present a 1D drift-diffusion solver for single-event simulation. Owing to its computational speed and circuit-coupling ability, the module is embedded in our soft error rate simulation platform, enabling projections on logic cells in 28 nm FD-SOI.
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https://hal-amu.archives-ouvertes.fr/hal-01788174
Contributor : Jean-Luc Autran <>
Submitted on : Tuesday, May 8, 2018 - 6:14:10 PM
Last modification on : Thursday, May 10, 2018 - 2:13:30 AM
Long-term archiving on: : Monday, September 24, 2018 - 1:40:05 PM

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  • HAL Id : hal-01788174, version 1

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Victor Malherbe, Gilles Gasiot, Thomas Thery, Jean-Luc Autran, Philippe Roche. Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1D Case Applied to 28 nm FD-SOI Devices. NSREC 2017, Jul 2017, New Orleans, United States. ⟨hal-01788174⟩

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