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Analysis of Poly(tetrafluoroethylene) (PTFE) by XPS

Christophe Girardeaux 1, 2 Jean-Jacques Pireaux 3
1 L2MP - Laboratoire matériaux et microélectronique de Provence
2 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
3 PMR - Centre de Recherche en Physique de la Matière et du Rayonnement [Namur]
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https://hal-amu.archives-ouvertes.fr/hal-02045073
Contributor : Christophe Girardeaux Connect in order to contact the contributor
Submitted on : Thursday, February 21, 2019 - 5:55:56 PM
Last modification on : Friday, October 22, 2021 - 3:48:10 AM

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  • HAL Id : hal-02045073, version 1

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Christophe Girardeaux, Jean-Jacques Pireaux. Analysis of Poly(tetrafluoroethylene) (PTFE) by XPS. Surface Science Spectra, American Vacuum Society, 1996, 4 (2), pp.138-141. ⟨hal-02045073⟩

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