N. Rodriguez, J. Adrian, C. Grosjean, G. Haller, C. Girardeaux, et al.. Evaluation of scanning capacitance microscopy sample preparation by focused ion beam.
Microelectronics Reliability, Elsevier, 2006, 46 (9-11), pp.1554-1557.
⟨10.1016/j.microrel.2006.07.019⟩.
⟨hal-02386240⟩