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Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films

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https://hal-amu.archives-ouvertes.fr/hal-02394011
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Submitted on : Wednesday, December 4, 2019 - 3:55:22 PM
Last modification on : Tuesday, October 19, 2021 - 11:00:01 PM

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Alain Portavoce, Ivan Blum, Lee Chow, Jean Bernardini, Dominique Mangelinck. Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films. Defect and Diffusion Forum, Trans Tech Publications, 2011, 309-310, pp.63-72. ⟨10.4028/www.scientific.net/DDF.309-310.63⟩. ⟨hal-02394011⟩

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