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Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films

Alain Portavoce 1 Ivan Blum 1 Lee Chow Jean Bernardini 1 Dominique Mangelinck 1 
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
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https://hal-amu.archives-ouvertes.fr/hal-02394011
Contributor : Alain Portavoce Connect in order to contact the contributor
Submitted on : Wednesday, December 4, 2019 - 3:55:22 PM
Last modification on : Tuesday, October 19, 2021 - 11:00:01 PM

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UNIV-TLN | CNRS | UNIV-AMU | IM2NP

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Alain Portavoce, Ivan Blum, Lee Chow, Jean Bernardini, Dominique Mangelinck. Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films. Defect and Diffusion Forum, 2011, 309-310, pp.63-72. ⟨10.4028/www.scientific.net/DDF.309-310.63⟩. ⟨hal-02394011⟩

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