Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films - Archive ouverte HAL Access content directly
Journal Articles Defect and Diffusion Forum Year : 2011

Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films

Domains

Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci]

Alain Portavoce  : Connect in order to contact the contributor

https://hal-amu.archives-ouvertes.fr/hal-02394011

Submitted on : Wednesday, December 4, 2019-3:55:22 PM

Last modification on : Friday, March 24, 2023-2:53:14 PM

Not file

Dates and versions

hal-02394011 , version 1 (04-12-2019)

Identifiers

Cite

Alain Portavoce, Ivan Blum, Lee Chow, Jean Bernardini, Dominique Mangelinck. Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films. Defect and Diffusion Forum, 2011, 309-310, pp.63-72. ⟨10.4028/www.scientific.net/DDF.309-310.63⟩. ⟨hal-02394011⟩

Export

BibTeX TEI Dublin Core DC Terms EndNote Datacite

Collections

UNIV-TLN CNRS UNIV-AMU IM2NP
23 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More