Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films - Archive ouverte HAL Access content directly
Journal Articles Defect and Diffusion Forum Year : 2011
Not file

Dates and versions

hal-02394011 , version 1 (04-12-2019)

Identifiers

Cite

Alain Portavoce, Ivan Blum, Lee Chow, Jean Bernardini, Dominique Mangelinck. Numerical Simulation Support for Diffusion Coefficient Measurements in Polycrystalline Thin Films. Defect and Diffusion Forum, 2011, 309-310, pp.63-72. ⟨10.4028/www.scientific.net/DDF.309-310.63⟩. ⟨hal-02394011⟩
23 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More