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In situ piezoelectric studies of PZT thin films by X-ray microdiffraction

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https://hal-amu.archives-ouvertes.fr/hal-01453231
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Submitted on : Thursday, February 2, 2017 - 4:19:03 PM
Last modification on : Wednesday, May 16, 2018 - 3:20:07 PM

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  • HAL Id : hal-01453231, version 1

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T. Cornelius, C. Mocuta, S. Escoubas, E.C. Lima, E.B. Araujo, et al.. In situ piezoelectric studies of PZT thin films by X-ray microdiffraction. 13th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP2016), Sep 2016, Brno, Czech Republic. ⟨hal-01453231⟩

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