Systematic in-situ nanotensile testing on a single Au nanowire with coherent X-ray diffraction

J. Shin

Conference papers

Systematic in-situ nanotensile testing on a single Au nanowire with coherent X-ray diffraction

J. Shin ¹

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

Complete list of metadatas

https://hal-amu.archives-ouvertes.fr/hal-01763102
Contributor : Im2np Bibliométrie <>
Submitted on : Tuesday, April 10, 2018 - 5:10:00 PM
Last modification on : Wednesday, April 11, 2018 - 1:29:26 AM

Systematic in-situ nanotensile testing on a single Au nanowire with coherent X-ray diffraction

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Systematic in-situ nanotensile testing on a single Au nanowire with coherent X-ray diffraction

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