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Systematic in-situ nanotensile testing on a single Au nanowire with coherent X-ray diffraction

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https://hal-amu.archives-ouvertes.fr/hal-01763102
Contributor : Im2np Bibliométrie <>
Submitted on : Tuesday, April 10, 2018 - 5:10:00 PM
Last modification on : Wednesday, April 11, 2018 - 1:29:26 AM

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  • HAL Id : hal-01763102, version 1

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J. Shin. Systematic in-situ nanotensile testing on a single Au nanowire with coherent X-ray diffraction. 2017 ESRF User Meeting , Feb 2017, Grenoble, France. ⟨hal-01763102⟩

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