Systematic in-situ nanotensile testing on a single Au nanowire with coherent X-ray diffraction - Archive ouverte HAL Access content directly
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Systematic in-situ nanotensile testing on a single Au nanowire with coherent X-ray diffraction

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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https://hal-amu.archives-ouvertes.fr/hal-01763102

Submitted on : Tuesday, April 10, 2018-5:10:00 PM

Last modification on : Friday, March 24, 2023-2:53:07 PM

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hal-01763102 , version 1 (10-04-2018)

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  • HAL Id : hal-01763102 , version 1

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J. Shin. Systematic in-situ nanotensile testing on a single Au nanowire with coherent X-ray diffraction. 2017 ESRF User Meeting , Feb 2017, Grenoble, France. ⟨hal-01763102⟩

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