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In-situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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https://hal-amu.archives-ouvertes.fr/hal-01763105

Submitted on : Tuesday, April 10, 2018-5:12:00 PM

Last modification on : Friday, March 24, 2023-2:53:07 PM

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hal-01763105 , version 1 (10-04-2018)

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  • HAL Id : hal-01763105 , version 1

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J. Shin. In-situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire. 2017 ECI Conference, Oct 2017, Dubrovnik, Croatia. ⟨hal-01763105⟩

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