In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

T.W. Cornelius; J. Shin; S. Labat; F. Lauraux; M.-I. Richard; G. Richter; D.S. Gianola; O. Thomas

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In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

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1

T.W. Cornelius

Function : Author
PersonId : 18168
IdHAL : thcornelius
ORCID : 0000-0003-4272-4720
IdRef : 200023373

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

CV

J. Shin

Function : Author
PersonId : 759391
ORCID : 0000-0003-4059-7748

S. Labat

Function : Author
PersonId : 19478
IdHAL : stephane-labat

F. Lauraux

Function : Author

M.-I. Richard

Function : Author
PersonId : 736272
IdHAL : marie-ingrid-richard
ORCID : 0000-0002-8172-3141
IdRef : 130070289

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

CV

G. Richter

Function : Author

D.S. Gianola

Function : Author

O. Thomas

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

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Micro and nanotechnologies/Microelectronics

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Submitted on : Monday, April 30, 2018-5:08:23 PM

Last modification on : Friday, March 24, 2023-2:53:07 PM

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hal-01781796 , version 1 (30-04-2018)

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HAL Id : hal-01781796 , version 1

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T.W. Cornelius, J. Shin, S. Labat, F. Lauraux, M.-I. Richard, et al.. In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction. E-MRS Spring Meeting 2017, May 2017, Strasbourg, France. ⟨hal-01781796⟩

In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

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