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Structured Roughness of Si Surface Obtained by Molecular Beam Epitaxy on Highly Misoriented Si(111) Substrate

J.-M. Gay 1 L. Lapena 1 M. Ladevèze M. Tolan 2 
1 CINaM - Centre Interdisciplinaire de Nanoscience de Marseille
2 TU - Technische Universität Dortmund [Dortmund]
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https://hal-amu.archives-ouvertes.fr/hal-01964075
Contributor : laurent lapena Connect in order to contact the contributor
Submitted on : Friday, December 21, 2018 - 5:31:38 PM
Last modification on : Tuesday, October 19, 2021 - 10:49:13 PM

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J.-M. Gay, L. Lapena, M. Ladevèze, M. Tolan. Structured Roughness of Si Surface Obtained by Molecular Beam Epitaxy on Highly Misoriented Si(111) Substrate. Surface Review and Letters, World Scientific Publishing, 1998, 05 (01), pp.31-36. ⟨hal-01964075⟩

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