Journal Articles
Surface Review and Letters
Year : 1998
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https://hal-amu.archives-ouvertes.fr/hal-01964075
Submitted on : Friday, December 21, 2018-5:31:38 PM
Last modification on : Friday, March 24, 2023-2:53:09 PM
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- HAL Id : hal-01964075 , version 1
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J.-M. Gay, L. Lapena, M. Ladevèze, M. Tolan. Structured Roughness of Si Surface Obtained by Molecular Beam Epitaxy on Highly Misoriented Si(111) Substrate. Surface Review and Letters, 1998, 05 (01), pp.31-36. ⟨hal-01964075⟩
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