Atomic Transport in Nano-Crystalline Silicides Studied by <i>In Situ</i> Auger Electron Spectroscopy: Interfacial Reaction Effect - Archive ouverte HAL Access content directly
Journal Articles Defect and Diffusion Forum Year : 2015

Atomic Transport in Nano-Crystalline Silicides Studied by In Situ Auger Electron Spectroscopy: Interfacial Reaction Effect

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Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci]

Christophe Girardeaux  : Connect in order to contact the contributor

https://hal-amu.archives-ouvertes.fr/hal-02044842

Submitted on : Thursday, February 21, 2019-4:36:35 PM

Last modification on : Wednesday, February 8, 2023-5:11:06 PM

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hal-02044842 , version 1 (21-02-2019)

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Alain Portavoce, Khalid Houmada, Franck Dahlem, Christophe Girardeaux, Boubekeur Lalmi. Atomic Transport in Nano-Crystalline Silicides Studied by In Situ Auger Electron Spectroscopy: Interfacial Reaction Effect. Defect and Diffusion Forum, 2015, 363, pp.12-20. ⟨10.4028/www.scientific.net/DDF.363.12⟩. ⟨hal-02044842⟩

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