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Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

A. Portavoce 1 N. Rodriguez Rachid Daineche 1 C. Grosjean Christophe Girardeaux 1
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
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https://hal-amu.archives-ouvertes.fr/hal-02044979
Contributor : Christophe Girardeaux Connect in order to contact the contributor
Submitted on : Thursday, February 21, 2019 - 5:04:18 PM
Last modification on : Tuesday, October 19, 2021 - 11:00:02 PM

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  • HAL Id : hal-02044979, version 1

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UNIV-AMU | CNRS | IM2NP | UNIV-TLN

Citation

A. Portavoce, N. Rodriguez, Rachid Daineche, C. Grosjean, Christophe Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements. Materials Letters, Elsevier, 2009, 63 (8), pp.676-678. ⟨hal-02044979⟩

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