Journal Articles
Materials Letters
Year : 2009
Christophe Girardeaux : Connect in order to contact the contributor
https://hal-amu.archives-ouvertes.fr/hal-02044979
Submitted on : Thursday, February 21, 2019-5:04:18 PM
Last modification on : Wednesday, February 8, 2023-5:11:06 PM
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- HAL Id : hal-02044979 , version 1
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A. Portavoce, N. Rodriguez, Rachid Daineche, C. Grosjean, Christophe Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements. Materials Letters, 2009, 63 (8), pp.676-678. ⟨hal-02044979⟩
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