https://hal-amu.archives-ouvertes.fr/hal-02044979
Contributor : Christophe Girardeaux <>
Submitted on : Thursday, February 21, 2019 - 5:04:18 PM Last modification on : Tuesday, March 30, 2021 - 3:23:30 AM
A. Portavoce, N. Rodriguez, Rachid Daineche, C. Grosjean, Christophe Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements. Materials Letters, Elsevier, 2009, 63 (8), pp.676-678. ⟨hal-02044979⟩