Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

A. Portavoce; N. Rodriguez; Rachid Daineche; C. Grosjean; Christophe Girardeaux

Journal Articles Materials Letters Year : 2009

Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

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1

A. Portavoce

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

N. Rodriguez

Function : Author

Rachid Daineche

Function : Author
PersonId : 19392
IdHAL : rachid-daineche
IdRef : 10139571X

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

C. Grosjean

Function : Author

Christophe Girardeaux

Function : Author
PersonId : 172869
IdHAL : christophe-girardeaux
ORCID : 0000-0002-7159-3785
IdRef : 078779375

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Domains

Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci]

Christophe Girardeaux : Connect in order to contact the contributor

https://hal-amu.archives-ouvertes.fr/hal-02044979

Submitted on : Thursday, February 21, 2019-5:04:18 PM

Last modification on : Wednesday, February 8, 2023-5:11:06 PM

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hal-02044979 , version 1 (21-02-2019)

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HAL Id : hal-02044979 , version 1

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A. Portavoce, N. Rodriguez, Rachid Daineche, C. Grosjean, Christophe Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements. Materials Letters, 2009, 63 (8), pp.676-678. ⟨hal-02044979⟩

Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

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