https://hal-amu.archives-ouvertes.fr/hal-02045037
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Submitted on : Thursday, February 21, 2019 - 5:42:02 PM Last modification on : Tuesday, September 24, 2019 - 1:19:14 AM
J Nyéki, Christophe Girardeaux, Z Erdélyi, G.A Langer, G Erdélyi, et al.. AES study of surface segregation of Ge in amorphous Si1−xGex thin film alloys. Surface Science, Elsevier, 2001, 495 (3), pp.195-203. ⟨hal-02045037⟩