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AES study of surface segregation of Ge in amorphous Si1−xGex thin film alloys

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https://hal-amu.archives-ouvertes.fr/hal-02045037
Contributor : Christophe Girardeaux Connect in order to contact the contributor
Submitted on : Thursday, February 21, 2019 - 5:42:02 PM
Last modification on : Tuesday, September 24, 2019 - 1:19:14 AM

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  • HAL Id : hal-02045037, version 1

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J Nyéki, Christophe Girardeaux, Z Erdélyi, G.A Langer, G Erdélyi, et al.. AES study of surface segregation of Ge in amorphous Si1−xGex thin film alloys. Surface Science, Elsevier, 2001, 495 (3), pp.195-203. ⟨hal-02045037⟩

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