Nanometer-scale control of single quantum dot nucleation through focused ion-beam implantation

A. Portavoce; R. Hull; M. Reuter; F. Ross

doi:10.1103/PhysRevB.76.235301

Journal articles

Nanometer-scale control of single quantum dot nucleation through focused ion-beam implantation

A. Portavoce ¹ R. Hull M. Reuter ² F. Ross

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

2 IUP - Institute of Environmental Physics [Bremen]

Document type :

Journal articles

Domain :

Physics [physics] / Condensed Matter [cond-mat] / Materials Science [cond-mat.mtrl-sci]

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https://hal-amu.archives-ouvertes.fr/hal-02386231
Contributor : Alain Portavoce Connect in order to contact the contributor
Submitted on : Friday, November 29, 2019 - 11:26:21 AM
Last modification on : Tuesday, October 19, 2021 - 11:00:04 PM

Nanometer-scale control of single quantum dot nucleation through focused ion-beam implantation

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Nanometer-scale control of single quantum dot nucleation through focused ion-beam implantation

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