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Nanometer-scale control of single quantum dot nucleation through focused ion-beam implantation

A. Portavoce 1 R. Hull M. Reuter 2 F. Ross
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
2 IUP - Institute of Environmental Physics [Bremen]
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https://hal-amu.archives-ouvertes.fr/hal-02386231
Contributor : Alain Portavoce Connect in order to contact the contributor
Submitted on : Friday, November 29, 2019 - 11:26:21 AM
Last modification on : Tuesday, October 19, 2021 - 11:00:04 PM

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UNIV-AMU | IM2NP | UNIV-TLN | CNRS

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A. Portavoce, R. Hull, M. Reuter, F. Ross. Nanometer-scale control of single quantum dot nucleation through focused ion-beam implantation. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2007, 76 (23), ⟨10.1103/PhysRevB.76.235301⟩. ⟨hal-02386231⟩

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